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Volumn 188, Issue 1, 1997, Pages 72-78

Backscattered electron imaging of cultured cells: Application to electron probe X-ray microanalysis using a scanning electron microscope

Author keywords

Backscattered electron imaging; cell culture; Scanning electron microscopy; X ray microanalysis

Indexed keywords

BACKSCATTERING; CELLS; ELECTRON PROBE MICROANALYSIS; ELECTRON SCATTERING; ELECTRONS; PROBES; TISSUE; TISSUE CULTURE;

EID: 0030667829     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.2329792.x     Document Type: Article
Times cited : (7)

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