Characterization of the Fe-Al interfacial layer in a commercial hot-dip galvanized coating

ISIJ International

Volumn 37, Issue 8, 1997, Pages 776-782

  Mcdevitt, E ^a   Morimoto, Y ^b   Meshii, M ^a  

^a Northwestern University   (United States)

^b NIPPON STEEL CORPORATION   (Japan)

Author keywords

Hot dip galvanizing; Inhibition layer; Interstitial free rephosphorized steel; Interstitial free steel; Phase transformations; SEM; TEM; Tem sample preparation; X ray diffraction

Indexed keywords

ALUMINUM; CHARACTERIZATION; CORROSION INHIBITORS; GALVANIZING; GRAIN BOUNDARIES; INTERDIFFUSION (SOLIDS); IRON; PHASE TRANSITIONS; PROTECTIVE COATINGS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

COMMERCIAL HOT DIP GALVANIZED COATING; GALVANNEALING; INTERSTITIAL FREE REPHOSPHORIZED STEEL; INTERSTITIAL FREE STEEL; IRON ALUMINUM INTERFACIAL LAYER;

INTERFACES (MATERIALS);

EID: 0030658585     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.37.776     Document Type: Article

References (25)

1. D. Horstmann: Arch. Eisenhüttenwes., 27 (1956), 297.
2. G. J. Harvey and P. D. Mercer: Metall. Trans., 4 (1973), 619.
3. J. Faderl, W. Maschek and J. Strutzenberger: Galvatech '95, Iron and Steel Society, Warrendale, PA, (1995), 675.
4. C. S. Lin and M. Meshii: Galvatech '95, (1995), 335.
5. M. Isobe, K. Yasuda and K. Yamato: CAMP-ISIJ, 5 (1992), 1629.
6. M. Guttman, Y. Leprete, A. Aubry, M. J. Roch, T. Morwau, P. Drillet, J. M. Mataigne and H. Baudin: Galvatech '95, Iron and Steel Society, Warrendale, PA, (1995), 295.
7. M. Saito, Y. Uchida, T. Kittaka, Y. Hirose and Y. Hisamatsu: Tetsu-to-Hagané, 77 (1991), 947.
8. A. R. Borzillo and W. C. Hahn: Trans. Am. Soc. Met., 62 (1969), 729.
9. A. R. P. Ghuman and J. I. Goldstein: Metall. Trans., 2 (1971), 2903.
10. M. Urednicek and J. S. Kirkaldy: Z. Metallkd., 64 (1973), 899.
11. A. Nishimoto, J. Inagaki and K. Nakaoka: Trans. Iron Steel Inst. Jpn., 26 (1986), 807.
12. C. S. Lin: Ph. D. Thesis, Northwestern University, (1994).
13. L. A. Giannuzzi, P. R. Howell, H. W. Pickering and W. R. Bitler: Specimen Preparation for Transmission Electron Microscopy of Materials-III, ed. by R. Anderson, B. Tracy and J. Bravman, MRS, 254 (1992), 159.
14. D. Joy: Monte Carlo Simulation Software, (1995).
15. D. B. Williams: Practical Analytical Electron Microscopy in Materials Science, 2nd Ed., Philips Electron Optics Publishing Group, Mahwah, New Jersey, (1987).
16. J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, A. D. Romig, Jr., C. E. Lyman, C. Fiori and E. Lifshin: Scanning Electron Microscopy and X-Ray Microanalysis, 2nd Ed., Plenum Press, New York, (1992).
17. J. J. Heixmann, A. Vadon, D. Schlatter and J. Bessieres: Advances in X-ray Analysis, 32 (1988), 285.
18. R. A. Larsen, T. F. McNulty, R. P. Goehner and K. R. Crystal: Advances in X-ray Analysis, 32 (1988), 311.
19. S. S. Iyengar, M. W. Santana, H. Windischmann and P. Engler: Advances in X-ray Analysis, 30 (1986), 457.
20. P. Angermeyer, M. Mayr, J. Angeli and J. Faderl: Z. Metallkd., 84 (1993), 716.
21. Z. W. Chen, R. M. Sharp and J. T. Gregory: Mater. Forum, 14 (1990), 130.
22. N. Y. Tang: Mater. Sci. Technol., 11 (1995), 870.
23. C. S. Lin, M. Meshii and C. C. Cheng: Galvatech '95, Iron and Steel Society, Warrendale, PA, (1995), 485.
24. Y. Morimoto, E. T. McDevitt and M. Meshii: to be published in ISIJ Int., (1997).
25. P. Perrot, J. C. Tissier and J-Y. Dauphin: Z. Metallkd., 83 (1992), 786.