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Volumn , Issue , 1997, Pages 81-84

Measurements and simulations of excess carrier distributions in 3.3 kV IGBTs during static conditions and turn-on

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; COMPUTER SIMULATION; CURRENT DENSITY; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0030658445     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (7)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.