Atomic force microscopy study of stabilized quasi-amorphous carbon in the range of thickness from 5 nm to 300 μm

Materials Research Society Symposium - Proceedings

Volumn 466, Issue , 1997, Pages 233-238

  Pollak, Fred H ^a   Wan, J Z ^a   Dorfman, Benjamin F ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (SPECIFIC GRAVITY); INTERFACES (MATERIALS); MECHANICAL PROPERTIES; SILICA; SURFACE STRUCTURE; THERMODYNAMIC STABILITY; THIN FILMS;

QUASI AMORPHOUS MATERIALS;

CARBON;

EID: 0030658249     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)