Digital components for built-in self-test of analog circuits

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 1997, Pages 47-51

  Stroud, Charles ^a   Karunaratna, Piyumani ^a   Bradley, Eugene ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; FREQUENCY RESPONSE; INTEGRATED CIRCUIT TESTING;

BUILT IN SELF TEST (BIST); OUTPUT RESPONSE ANALYSIS; TEST PATTERN GENERATOR;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 0030656114     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)