Curvature based descriptor invariant to pose and albedo derived from photometric data

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 1997, Pages 165-171

  Angelopoulou, Elli ^a   Williams, James P ^a   Wolff, Lawrence B ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE QUALITY; LIGHTING; MATRIX ALGEBRA; PHOTOMETRY;

GAUSSIAN CURVATURE; LAMBERTIAN SURFACES;

OBJECT RECOGNITION;

EID: 0030655683     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)