Modeling reverse short channel and narrow width effects in small size MOSFET's for circuit simulation

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 1997, Pages 249-252

  Cheng, Yuhua ^a   Sugii, Toshihiro ^a   Chen, Kai ^a   Liu, Zhihong ^a   Jeng, Min Chie ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC NETWORK ANALYSIS; ION IMPLANTATION; MOSFET DEVICES; VLSI CIRCUITS;

NARROW WIDTH EFFECTS; POCKET IMPLANT PROCESSES; REVERSE SHORT CHANNEL;

COMPUTER SIMULATION;

EID: 0030655664     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)