Pulsed-measurement based electrothermal model of HBT with thermal stability prediction capabilities

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1997, Pages 1515-1518

  Peyretaillade, T ^a   Perez, M ^a   Mons, S ^a   Sommet, R ^a   Auxemery, Ph ^a   Lalaurie, J C ^a   Quere, R ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; SEMICONDUCTOR DEVICE MODELS; THERMODYNAMIC STABILITY; THERMOELECTRICITY; VOLTAGE MEASUREMENT;

ELECTROTHERMAL NONLINEAR MODEL; PULSED MEASUREMENT;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0030655433     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)