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Volumn , Issue , 1997, Pages 129-130
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Fabrication of 100 nm pMOSFETs with hybrid AFM/STM lithography
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
MOSFET DEVICES;
PHOTOLITHOGRAPHY;
SCANNING TUNNELING MICROSCOPY;
SCANNING PROBE LITHOGRAPHY (SPL);
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 0030655214
PISSN: 07431562
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (3)
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