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Volumn 442, Issue , 1997, Pages 355-365
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Defects in low temperature MBE-grown Si and SiGe/Si structures
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONS;
ENERGY GAP;
HEAT TREATMENT;
HYDROGEN;
ION BOMBARDMENT;
MAGNETIC RESONANCE SPECTROSCOPY;
MOLECULAR BEAM EPITAXY;
POINT DEFECTS;
SEMICONDUCTING GERMANIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR GROWTH;
BANDGAP;
LOW TEMPERATURE GROWTH;
NON RADIATIVE DEFECT;
OPTICAL DETECTION OF MAGNETIC RESONANCE;
HETEROJUNCTIONS;
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EID: 0030655103
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (18)
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