Whole-chip ESD protection design for submicron CMOS VLSI

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 3, Issue , 1997, Pages 1920-1923

  Ker, Ming Dou ^a   Liu, Shue Chang ^a  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; SEMICONDUCTOR DEVICE TESTING; VLSI CIRCUITS;

SUBMICRON INTEGRATED CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 0030655083     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)