Comparison of air coplanar microprobes for on-wafer measurements at W-band

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1997, Pages 1659-1662

  Pham, A ^a   Laskar, J ^a   Basu, S ^a   Pence, J ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; STANDARDS;

AIR COPLANAR MICROPROBES; THRU-REFLECT-LINE (TRL) CALIBRATIONS;

WAVEGUIDES;

EID: 0030654885     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)