Atomic structure and electrical properties of a supertip gas field-ion source

Materials Science Forum

Volumn 248-249, Issue , 1997, Pages 433-438

  Miller, Th ^a   Knoblauch, A ^a   Kalbitzer, S ^a  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

Author keywords

Field Ionization; Field Ion Microscopy; Supertip

Indexed keywords

CHEMICAL MODIFICATION; CRYSTAL ATOMIC STRUCTURE; ELECTRIC FIELD MEASUREMENT; ELECTRIC PROPERTIES; IONIZATION OF SOLIDS; IONS; MICROSCOPIC EXAMINATION;

FIELD ION MICROSCOPY; GAS FIELD ION SOURCES (GFIS); TUNGSTEN SUPERTIPS;

TUNGSTEN;

EID: 0030654499     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.248-249.433     Document Type: Article

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