Comparison of grain boundary monolayer segregation measurements made using FEGSTEM and Auger spectroscopy

Materials Research Society Symposium - Proceedings

Volumn 439, Issue , 1997, Pages 533-538

  Fisher, S B ^a   Spellward, P ^a   Scowen, R ^a   Lee, B ^a  

^a Berkeley Technology Cent   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; SEGREGATION (METALLOGRAPHY); TRANSMISSION ELECTRON MICROSCOPY;

FIELD EMISSION GUN SCANNING TRANSMISSION ELECTRON MICROSCOPE; GRAIN BOUNDARY MICROCHEMISTRY;

GRAIN BOUNDARIES;

EID: 0030654056     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)