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Volumn 41, Issue 1-2, 1997, Pages 143-148

Masks for laser ablation technology: New requirements and challenges

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; DIELECTRIC FILMS; EXCIMER LASERS; LASER ABLATION; MICROELECTRONIC PROCESSING; PHOTOLITHOGRAPHY; POLYMERS; PROJECTION SYSTEMS; QUARTZ;

EID: 0030653743     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.411.0143     Document Type: Article
Times cited : (10)

References (20)
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  • 3
    • 0021466732 scopus 로고
    • Excimer Laser Projection Photoetching
    • M. Latta, R. Moore, S. Rice, and K. Jain, "Excimer Laser Projection Photoetching," J. Appl. Phys. 56, No. 5, 586-588 (1984).
    • (1984) J. Appl. Phys. , vol.56 , Issue.5 , pp. 586-588
    • Latta, M.1    Moore, R.2    Rice, S.3    Jain, K.4
  • 4
    • 84956252207 scopus 로고
    • Laser Ablation of Polymers
    • J. T. Yeh, "Laser Ablation of Polymers," J. Vac. Sci. Technol. A 4, No. 3, 653-658 (1986).
    • (1986) J. Vac. Sci. Technol. A , vol.4 , Issue.3 , pp. 653-658
    • Yeh, J.T.1
  • 5
    • 0026406017 scopus 로고
    • Polyimide Copper Thin Film Redistribution on Glass Ceramic/Copper Multilevel Substrates
    • T. Redmond, C. Prasad, and G. A. Walker, "Polyimide Copper Thin Film Redistribution on Glass Ceramic/Copper Multilevel Substrates," Proc. ECTC 41, 689-692 (1991).
    • (1991) Proc. ECTC , vol.41 , pp. 689-692
    • Redmond, T.1    Prasad, C.2    Walker, G.A.3
  • 7
    • 0027553108 scopus 로고
    • Polymer Ablation with a High Power Excimer Laser Tool
    • G. E. Wolbold, C. L. Tessler, and D. Tudryn, "Polymer Ablation with a High Power Excimer Laser Tool," Microelectron. Eng. 20, No. 1-2, 3-14 (1993).
    • (1993) Microelectron. Eng. , vol.20 , Issue.1-2 , pp. 3-14
    • Wolbold, G.E.1    Tessler, C.L.2    Tudryn, D.3
  • 8
    • 0029368149 scopus 로고
    • Laser Via Ablation Technology for MCMs Thin Film Packaging - Past, Present, and Future at IBM Microelectronics
    • R. S. Patel, T. F. Redmond, C. Tessler, D. Tudryn, and D. Pulaski, "Laser Via Ablation Technology for MCMs Thin Film Packaging - Past, Present, and Future at IBM Microelectronics," Int. J. Microcircuits & Electron. Packaging 18, No. 3, 266-274 (1995).
    • (1995) Int. J. Microcircuits & Electron. Packaging , vol.18 , Issue.3 , pp. 266-274
    • Patel, R.S.1    Redmond, T.F.2    Tessler, C.3    Tudryn, D.4    Pulaski, D.5
  • 9
    • 4043146828 scopus 로고
    • Excimer Laser Radiation: The Key to Advanced Technology
    • Lambda Physik, Acton, MA, November
    • "Excimer Laser Radiation: The Key to Advanced Technology," Industrial Report No. 8, Lambda Physik, Acton, MA, November 1994.
    • (1994) Industrial Report No. 8
  • 10
    • 34249839342 scopus 로고
    • Excimer Laser Ablation of Polyimide in a Manufacturing Facility
    • J. R. Lankard, Sr. and G. Wolbold, "Excimer Laser Ablation of Polyimide in a Manufacturing Facility," Appl. Phys. A 54, 355-359 (1992).
    • (1992) Appl. Phys. A , vol.54 , pp. 355-359
    • Lankard Sr., J.R.1    Wolbold, G.2
  • 12
    • 0001692675 scopus 로고
    • Chromium Mask Damage in Excimer Laser Projection Printing
    • J. T. Yeh, "Chromium Mask Damage in Excimer Laser Projection Printing," Proc. SPIE (Optical/Laser Microlithography) 922, 461-463 (1988).
    • (1988) Proc. SPIE (Optical/Laser Microlithography) , vol.922 , pp. 461-463
    • Yeh, J.T.1
  • 14
    • 4043074546 scopus 로고
    • Multiple Shot UV Laser Damage Resistance of Nonquarterwave Reflector Designs for 248 nm
    • Los Alamos National Laboratory, Los Alamos, NM
    • B. E. Newman, S. R. Foltyn, and L. John Jolin, "Multiple Shot UV Laser Damage Resistance of Nonquarterwave Reflector Designs for 248 nm," Report No. LA-UR-82-1774, Los Alamos National Laboratory, Los Alamos, NM, 1982.
    • (1982) Report No. LA-UR-82-1774
    • Newman, B.E.1    Foltyn, S.R.2    John Jolin, L.3
  • 15
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    • Laser Damage Results and Analyses for UV Reflectors under Multiple Shot Irradiation
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    • (1982) Report No. LA-UR-82-1269
    • Foltyn, S.R.1    Newman, B.E.2    John Jolin, L.3
  • 17
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    • Detection and Printability of Shifter Defects in Phase-Shifting Masks
    • November
    • H. Watanabe, Y. Todokoro, and M. Inoue, "Detection and Printability of Shifter Defects in Phase-Shifting Masks," Jpn. J. Appl. Phys. 30, No. 11B, 3016-3020 (November 1991).
    • (1991) Jpn. J. Appl. Phys. , vol.30 , Issue.11 B , pp. 3016-3020
    • Watanabe, H.1    Todokoro, Y.2    Inoue, M.3
  • 19
    • 4043093100 scopus 로고    scopus 로고
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  • 20
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    • Harper, J.M.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.