MicroRaman spectroscopy and X-ray diffraction studies of Ti-W-O thin films

Materials Research Society Symposium - Proceedings

Volumn 441, Issue , 1997, Pages 475-480

  Sangaletti, Luigi ^a   Bontempi, Elza ^a   Depero, Laura E ^a   Galinetto, P ^a   Groppelli, Silvio ^a   Salari, Roberto ^a   Sberveglieri, Giorgio ^a  

^a UNIVERSITY OF BRESCIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; HIGH TEMPERATURE EFFECTS; MORPHOLOGY; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPUTTERING; TITANIUM COMPOUNDS; X RAY CRYSTALLOGRAPHY;

MICRO RAMAN SPECTROSCOPY;

THIN FILMS;

EID: 0030653290     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)