Optical dielectric response of gallium nitride studied by variable angle spectroscopic ellipsometry

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 805-810

  Yao, H ^a   Yan, C H ^a   Zavada, J M ^a   Jenhinson, H A ^a   Speck, J S ^a   Denbaars, S P ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; LIGHT EMITTING DIODES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR LASERS;

OPTICAL DIELECTRIC RESPONSE; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY; WURTZITE CRYSTAL STRUCTURE;

THIN FILMS;

EID: 0030652644     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)