SLCP - The scanning diffusion limited current probe: A new method for spatially resolved analysis

Electrochimica Acta

Volumn 42, Issue 20-22, 1997, Pages 3085-3094

  Kupper M ^a   Schultze, J W ^a  

^a HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

Analysis; Chronoamperometry; Microelectrodes; SECM; Spatially resolved

Indexed keywords

ASPECT RATIO; COMPOSITION; CYCLIC VOLTAMMETRY; DIFFUSION IN SOLIDS; ELECTRIC CURRENTS; MICROSTRUCTURE; PROBES;

CHRONOAMPEROMETRY; SCANNING DIFFUSION LIMITED CURRENT PROBE (SLCP); SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);

MICROELECTRODES;

EID: 0030652085     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(97)00156-4     Document Type: Article

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