Rutherford back-scattering measurements of antimony diffusion in nanocrystalline copper

Nanostructured Materials

Volumn 8, Issue 1, 1997, Pages 37-44

  Balandin, I L ^a   Bokstein, B S ^a   Egorov, V K ^b   Kurkin, P V ^a  

^a NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

^b INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANTIMONY; COPPER; DIFFUSION IN SOLIDS; GRAIN BOUNDARIES; POROSITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THERMAL EFFECTS;

NANOGRAIN BOUNDARY DIFFUSION;

NANOSTRUCTURED MATERIALS;

EID: 0030651960     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(97)00063-9     Document Type: Article

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