Hybrid algorithm for test point selection for scan-based BIST

Proceedings - Design Automation Conference

Volumn , Issue , 1997, Pages 478-483

  Tsai, Huan Chih ^a   Cheng, Kwang Ting ^a   Lin, Chih Jen ^a   Bhawmik, Sudipta ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPUTATIONAL COMPLEXITY; COMPUTER CIRCUITS; COMPUTER SIMULATION;

FAULT SIMULATION; SCAN BASED BUILT IN SELF TEST; TEST POINT SELECTION;

ALGORITHMS;

EID: 0030651959     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)