SPITFIRE: Scalable parallel algorithms for test set partitioned fault simulation

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 274-281

  Krishnaswamy, Dilip ^a   Rudnick, Elizabeth M ^a   Patel, Janak H ^a   Banerjee, Prithviraj ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; INTEGRATED CIRCUIT TESTING; PARALLEL PROCESSING SYSTEMS; SEQUENTIAL CIRCUITS; VLSI CIRCUITS;

FAULT COVERAGE;

PARALLEL ALGORITHMS;

EID: 0030651234     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)