Differential sensing strategy for dynamic thermal testing of ICs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 434-439

  Altet, Josep ^a   Rubio, Antonio ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT CONDUCTION; SENSORS; THERMAL VARIABLES MEASUREMENT; THERMODYNAMIC STABILITY;

DYNAMIC THERMAL TESTING; THERMAL SENSORS;

INTEGRATED CIRCUIT TESTING;

EID: 0030651228     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)