High-resolution x-ray diffraction of GaN grown on sapphire substrates

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 477-482

  Saxler, A ^a   Capano, M A ^a   Mitchel, W C ^a   Kung, P ^a   Zhang, X ^a   Walker, D ^a   Razeghi, M ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITRIDES; X RAY DIFFRACTION ANALYSIS;

GALLIUM NITRIDE;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0030651205     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)