Flicker noise characterization of polysilicon resistors in submicron BICMOS technologies

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1997, Pages 49-51

  Buisson, O Roux dit ^a   Morin, G ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; SEMICONDUCTING SILICON; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

FLICKER NOISE; POLYSILICON FILM RESISTORS;

RESISTORS;

EID: 0030650494     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)