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Volumn , Issue , 1997, Pages 210-213
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DFT for embedded charge-pump PLL systems incorporating IEEE 1149.1
a
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
INTEGRATED CIRCUIT LAYOUT;
PHASE LOCKED LOOPS;
STANDARDS;
VARIABLE FREQUENCY OSCILLATORS;
CHARGE PUMP PHASE LOCKED LOOPS (CP PLL);
DESIGN FOR TEST (DFT) TECHNIQUE;
INTEGRATED CIRCUIT TESTING;
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EID: 0030649391
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (15)
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References (10)
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