Secondary ion enhancement in slow highly charged heavy ion bombardment

Physica Scripta T

Volumn 73, Issue , 1997, Pages 326-328

  Terasawa, M ^a   Sekioka, T ^a   Mitamura, T ^a   Winecki, S ^b   Stockli M P ^b   Cocke, C L ^b  

^a UNIVERSITY OF HYOGO   (Japan)

^b KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHARGE TRANSFER; THIN FILMS; XENON;

CARBON THIN FILMS; SECONDARY IONS;

ION BOMBARDMENT;

EID: 0030649208     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/1997/t73/108     Document Type: Article

References (7)

1. Hardy, V., Groult, D., Hervieu, M., Provost, J. and Raveau, B., Nucl. Instr. Meth. B54, 472 (1991).
2. Civale, L. et al., Phys. Rev. Lett. 67, 648 (1991).
3. Terasawa, M. et al., Trans. Mat. Soc. Jpn. 17, 383 (1994); Physica C235-240, 2805 (1994).
4. Terasawa, M. et al., Trans. Mat. Soc. Jpn. 17, 383 (1994); Physica C235-240, 2805 (1994).
5. Dunlop, A. and Lesueur, D., Radiat. Eff. Defects Solids 126, 123 (1993).
6. Kakutani, N., Azuma, T., Yamazaki, Y., Komaki, K. and Kuroki, K., Jpn. J. Appl. Phys. 34, L580 (1995).
7. For example: Blanco, S. A., Falcon, C. A., Reinhold, C. O., Casaubon, J. I. and Piacentini, R. D., J. Phys. B20, 6295 (1987).