Ultrafast processes in wide bandgap insulators

Materials Science Forum

Volumn 239-241, Issue , 1997, Pages 555-560

  Petite, G ^a   Daguzan, P ^a   Guizard, S ^a   Martin, P ^a  

^a CEA SACLAY   (France)

Author keywords

Charge Trapping; Laser Solid Interactions; Point Defects; Ultrafast Phenomena

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRONS; INTERFEROMETRY; LASER PULSES; MONTE CARLO METHODS; OXIDES; PHONONS; POINT DEFECTS; ULTRAFAST PHENOMENA;

CHARGE TRAPPING; LASER SOLID INTERACTIONS; TRANSIENT FREQUENCIAL INTERFEROMETRY; WIDE BANDGAP INSULATORS;

ELECTRIC INSULATING MATERIALS;

EID: 0030648212     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.239-241.555     Document Type: Article

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