Automated testing methodologies for low cost, parallel optical bus components

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 1997, Pages 217-224

  Stawiasz, Kevin ^a   Kuchta, Dan ^a   Xiao, Peter ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COST ACCOUNTING; OPTICAL LINKS; SEMICONDUCTOR LASERS;

PARALLEL OPTICAL BUS MODULES; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

INTEGRATED OPTOELECTRONICS;

EID: 0030647713     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)