Enhancement of the spontaneous emission rates in all porous silicon optical microcavities

Materials Research Society Symposium - Proceedings

Volumn 452, Issue , 1997, Pages 717-722

  Pavesi, L ^a   Cazzanelli, M ^a   Bisi, O ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FABRY-PEROT INTERFEROMETERS; LIGHT EMISSION; OPTICAL RESONATORS; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; SEMICONDUCTOR DEVICE STRUCTURES; SPECTRUM ANALYSIS;

BRAGG REFLECTORS; FABRY-PEROT FILTERS; OPTICAL MICROCAVITIES; PEAK EMISSION INTENSITY; TIME RESOLVED PHOTOLUMINESCENCE MEASUREMENT;

SEMICONDUCTING SILICON;

EID: 0030647676     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)