Microstructure and strengthening of creep-tested cryomilled NiAl-AlN

Materials Research Society Symposium - Proceedings

Volumn 460, Issue , 1997, Pages 413-418

  Garg, Anita ^a   Whittenberger, J Daniel ^a   Luton, Michael J ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CREEP; METALLOGRAPHIC MICROSTRUCTURE; SINGLE CRYSTALS; STRAIN RATE; STRENGTH OF MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM NITRIDE; NICKEL ALUMINIDE;

NICKEL COMPOUNDS;

EID: 0030647635     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)