Historical perspective and recent developments of hot-carrier generation modeling for device analysis

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 1997, Pages 5-8

  Sangiorgi, Enrico ^a  

^a UNIVERSITY OF UDINE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRONS; MATHEMATICAL MODELS; MAXWELL EQUATIONS; MOS DEVICES; SUBSTRATES;

HOT CARRIER EFFECTS; LUCKY ELECTRON MODELS; SEMICLASSICAL BOLTZMANN TRANSPORT EQUATION;

HOT CARRIERS;

EID: 0030647268     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)