Embedded atom model of surface stress and early film growth in electrodeposition: Ag/Au(111)

Materials Research Society Symposium - Proceedings

Volumn 451, Issue , 1997, Pages 31-35

  Haftel, Michael I ^a   Rosen, Mervine ^a   Corcoran, Sean G ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; ELECTRIC FIELD EFFECTS; FILM GROWTH; GOLD; INTERFACIAL ENERGY; MATHEMATICAL MODELS; METALLIC FILMS; SILVER; STRESS ANALYSIS;

EMBEDDED ATOM MODEL; STEP EDGE BARRIERS; STRANSKI KRASTANOV GROWTH;

ELECTRODEPOSITION;

EID: 0030646974     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)