Radiation-induced segregation of metals at moving SiO 2-amorphous Si interfaces

Materials Research Society Symposium - Proceedings

Volumn 439, Issue , 1997, Pages 575-580

  Williams, J S ^a   Petravic, M ^a   Conway, M ^a   Short, K T ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ION ASSISTED MIGRATION; RADIATION-INDUCED SEGREGATION (RIS);

INTERFACES (MATERIALS); ION BOMBARDMENT; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEGREGATION (METALLOGRAPHY); SILICA; SILICON; THERMAL EFFECTS;

GOLD;

EID: 0030646498     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)