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Volumn 11, Issue , 1997, Pages 163-164
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Femtosecond pulse diagnostic with use of two-photon conductivity in semiconductors
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC RESISTANCE MEASUREMENT;
ELECTROMAGNETIC DISPERSION;
INTERFEROMETERS;
LASER MODE LOCKING;
LASER PULSES;
OPTICAL CORRELATION;
SEMICONDUCTOR DEVICE STRUCTURES;
SOLID STATE LASERS;
FEMTOSECOND LASERS;
METAL SEMICONDUCTOR METAL (MSM) STRUCTURES;
MICHELSON INTERFEROMETER;
PHOTOCONDUCTING DEVICES;
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EID: 0030646301
PISSN: 10928081
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (3)
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