Diagnostic test pattern generation for sequential circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 196-202

  Hartanto, Ismed ^a   Boppana, Vamsi ^a   Patel, Janak H ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEQUENTIAL CIRCUITS; VLSI CIRCUITS;

AUTOMATIC TEST PATTERN GENERATION (ATPG); DIAGNOSTIC TEST GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0030645965     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)