Microprocessor design verification by two-phase evolution of variable length tests

Proceedings of the IEEE Conference on Evolutionary Computation, ICEC

Volumn , Issue , 1997, Pages 453-458

  Smith, J E ^a   Bartley, M ^a   Fogarty, T C ^a  

^a UNIVERSITY OF THE WEST OF ENGLAND   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; INTEGRATED CIRCUIT TESTING; MACHINE ORIENTED LANGUAGES; PROGRAM ASSEMBLERS;

ASSEMBLY CODE INSTRUCTIONS;

MICROPROCESSOR CHIPS;

EID: 0030645902     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)