Separation of superimposed ultrasonics pulse echo signals for semiconductor failure analysis using scanning acoustic tomography (S.A.T.)

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1997, Pages 136-140

  Jang, Hyoseong ^a   Jhang, Kyungyoung ^a   Lee, Dongkyung ^a  

^a D and S Department   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DELAMINATION; FAILURE ANALYSIS; NONDESTRUCTIVE EXAMINATION; RELIABILITY; SEMICONDUCTOR DEVICE TESTING; THERMAL CONDUCTIVITY OF SOLIDS; TRANSFER FUNCTIONS; ULTRASONIC APPLICATIONS;

SCANNING ACOUSTIC TOMOGRAPHY (SAT); SUPERIMPOSED PULSE ECHO SIGNALS;

SEMICONDUCTOR DEVICES;

EID: 0030645893     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)