Experimental study comparing the relative effectiveness of functional, scan, Iddq, and delay fault testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 316-

  Nigh, P ^a   Needham, W ^a   Butler, K ^a   Maxwell, P ^a   Aitken, R ^a   Gattiker, A ^a   Heighton, D ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT MANUFACTURE;

DELAY FAULT TESTING; FUNCTIONAL FAULT TESTING; SCAN FAULT TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0030644882     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)