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Volumn , Issue , 1997, Pages 167-170
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CMOS-circuit protection against PPID for yield enhancement
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITORS;
COMPUTER AIDED NETWORK ANALYSIS;
COMPUTER SIMULATION;
DIGITAL CIRCUITS;
DIGITAL TO ANALOG CONVERSION;
DISPLAY DEVICES;
GATES (TRANSISTOR);
ION BEAMS;
MOS DEVICES;
OXIDES;
PLASMA ETCHING;
SEMICONDUCTOR DEVICE TESTING;
FOCUSED ION BEAMS (FIB);
PLASMA INDUCED DAMAGE;
SOFTWARE PACKAGE SPICE;
CMOS INTEGRATED CIRCUITS;
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EID: 0030644846
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (0)
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