Hierarchy of reference materials certified for chemical composition

Metrologia

Volumn 34, Issue 1, 1997, Pages 35-39

  Pan, X R ^a  

^a National Research Centre for Certified Reference Materials   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT HIERARCHY; MEASUREMENT REFERENCE MATERIALS; MEASUREMENT STANDARDS; MEASUREMENT TRACEABILITY; MEASUREMENT UNCERTAINTY;

COMPOSITION; MEASUREMENT ERRORS; MEASUREMENT THEORY; STANDARDS; TERMINOLOGY; UNITS OF MEASUREMENT;

CHEMICAL ANALYSIS;

EID: 0030644299     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/34/1/6     Document Type: Article

References (19)

1. General requirements for the competence of calibration and testing laboratories, ISO/IEC Guide 25, Geneva, 1990.
2. International standard for quality management and quality assurance, ISO series 9000, Geneva, 1992.
3. International standards for quality assurance requirements for measuring equipment, ISO 10012, Geneva, 1992.
4. IUPAC Technical Report, Pure Appl. Chem., 1993, 65 (9), 2123-2144.
5. International guide to quality in analytical chemistry, CITAC Guide 1, UK, 1995.
6. Terms and definitions used in connection with reference materials, ISO Guide 30, 2nd ed., Geneva, 1992.
7. Contents of certificates of reference materials, ISO Guide 31, Geneva, 1981.
8. Calibration of chemical analyses and use of certified reference materials, ISO Guide 32, Geneva, 1996.
9. Uses of certified reference materials, ISO Guide 33, Geneva, 1989.
10. Quality system guidelines for the production of reference materials, ISO Guide 34, Geneva, 1996.
11. Certification of reference materials - general and statistical principles, ISO Guide 35, Geneva, 1989.
12. Hastenteufel S., Eurachem Newsletter, 1996, 10, 10.
13. De Bièvre P., Kaarls R., Accred. Qual. Assur., 1996, 1, 3-13.
14. De Bièvre P., Document CCQM/95-2a submitted to the 1st Meeting of the CCQM, 1995.
15. Milton M. J. T., Woods P. T., Quincey P. G., Document CCQM/96-17 submitted to the 2nd Meeting of the CCQM, 1996.
16. Pan X. R., VAM Bulletin, 1995, 12, 18-19.
17. Pan X. R., Accred. Qual. Assur., 1996, 1, 181-185.
18. Hasselbarth W., Paper submitted to the 18th Meeting of ISO/REMCO, Geneva, 1995.
19. International Vocabulary of Basic and General Terms in Metrology, 2nd ed., Geneva, International Organization for Standardization, 1993.