In situ surface characterization of SrTiO3 (100) substrates for well-defined SrTiO3 and YBa2Cu3O7-x thin film growth

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 1 A, 1997, Pages 90-93

  Nakamura, Takao ^a   Inada, Hiroshi ^a   Iiyama, Michitomo ^a  

^a SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

LEISS; Molecular beam epitaxy; Oxide superconductor; SrTiO3; Surface structure; Ultra thin film; YBa2Cu3O7 x

Indexed keywords

LOW ENERGY ION SCATTERING SPECTROSCOPY;

BARIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; SPECTROSCOPIC ANALYSIS; STRONTIUM COMPOUNDS; SUBSTRATES; SURFACE STRUCTURE;

SUPERCONDUCTING FILMS;

EID: 0030644273     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.36.90     Document Type: Article

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