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Volumn 32, Issue 1, 1997, Pages 111-124

Calculation of displacement fields and simulation of HRTEM images of dislocations in sphalerite type A(III)B(V) compound semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ELASTICITY; EPITAXIAL GROWTH; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SINGLE CRYSTALS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030644024     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.2170320111     Document Type: Article
Times cited : (8)

References (49)
  • 16
  • 17
    • 0003531591 scopus 로고
    • John Wiley and Sons, New York-Chichester-Brisbane-Toronto-Singapore
    • HIRTH, J. P., LOTHE, J.: Theory of Dislocations, Second Edition, John Wiley and Sons, New York-Chichester-Brisbane-Toronto-Singapore 1982, p. 22, 60, 78, 378
    • (1982) Theory of Dislocations, Second Edition , pp. 22
    • Hirth, J.P.1    Lothe, J.2
  • 32
    • 84915486805 scopus 로고
    • The Mathematical Theory of Stationary Dislocations
    • NABARRO, F. R. N.: The Mathematical Theory of Stationary Dislocations, Advances in Physics 1, 269 (1952)
    • (1952) Advances in Physics , vol.1 , pp. 269
    • Nabarro, F.R.N.1
  • 33
    • 85033514801 scopus 로고    scopus 로고
    • High-Resolution Electron Microscopy-Fundamentals and Applications
    • Halle/Saale
    • NEUMANN, W., PIPPEL, A., HOFMEISTER, H.: High-Resolution Electron Microscopy-Fundamentals and Applications. Proc. Int. Autumn School 1991, Halle/Saale, p. 95
    • Proc. Int. Autumn School 1991 , pp. 95
    • Neumann, W.1    Pippel, A.2    Hofmeister, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.