Fault and diagnosis on a successive approximation ADC

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1997, Pages 1460-1463

  Marc, François ^a   Dallet, Dominique ^a   Danto, Yves ^a  

^a UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRON BEAMS; FAILURE ANALYSIS;

A/D CONVERTER; BEAM TESTING; BIT-ERRORS; ELECTRICAL CHARACTERIZATION; REAL CASE; SUCCESSIVE APPROXIMATIONS; SUCCESSIVE-APPROXIMATION ADC;

ANALOG TO DIGITAL CONVERSION;

ELECTRICAL CHARACTERIZATIONS; ELECTRON BEAM TESTING (EBT); HISTOGRAM;

EID: 0030643698     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.1997.612441     Document Type: Conference Paper

References (5)

1. G.Franco, D.Dallet, G.Chiorboli, P.Marchegay, Study of Bit Error by Thermal Characterization of a Successive Approximation ADC, IEEE Instrumentation and Measurement Technology Conference, IEEE Cat. No. 95TH35783, pp. 640-643, 24-26 Avril 1995, Boston (USA).
2. J. Blair, "Histogram Measurement of ADC Nonlinearities Using Sine Waves," IEEE Trans. Instrum. Meas., vol. 43, n.3, pp.373-383, June 1994
3. J. Doernberg, H. Lee, D.A. Hodges, "Full-Speed Testing of A/D Converters," IEEE J. Solid State Circ., vol.SC-19, pp.820-827, December 1984
4. G. Dahlquist and A. Bjorck, Numerical Methods,Englewood Cliffs, NJ: Prentice-Hall, 1974, sec 5.8.2, pp.211-215
5. E.Menzel, E. Kubalek Fundamentals of electron beam testing of integrated circuits, Scanning vol.5, pp. 103-122, 1983.