|
Volumn 421, Issue 1-2, 1997, Pages 59-65
|
On the equivalence of free energy and pressure profile methods for determining the mechanical properties of double layers
a a |
Author keywords
Double layers; Free energy; Mechanical properties; Pressure profile
|
Indexed keywords
ADSORPTION;
APPROXIMATION THEORY;
ELECTRIC FIELD EFFECTS;
ELECTROCHEMICAL ELECTRODES;
ELECTROLYTES;
ELECTROSTATICS;
FREE ENERGY;
MATHEMATICAL MODELS;
MECHANICAL PROPERTIES;
SURFACE TENSION;
THERMODYNAMICS;
GOUY-CHAPMAN THEORY;
PRESSURE PROFILE;
INTERFACES (MATERIALS);
|
EID: 0030642568
PISSN: 15726657
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0728(96)04831-0 Document Type: Article |
Times cited : (4)
|
References (14)
|