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Volumn , Issue , 1997, Pages 176-181
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Toward more effective testing for high assurance systems
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA REDUCTION;
RELIABILITY;
SOFTWARE ENGINEERING;
HIGH ASSURANCE SYSTEMS;
COMPUTER SELECTION AND EVALUATION;
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EID: 0030635417
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (9)
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