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Volumn 331, Issue 1-2, 1996, Pages 125-130

Application of thallium(I) as an internal standard redox process in voltammetric measurements

Author keywords

internal standard; reproducibility; thallium(I); voltammetry

Indexed keywords

COPPER; LEAD; THALLIUM;

EID: 0030595375     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/0003-2670(96)00212-7     Document Type: Article
Times cited : (10)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.