On the number of high excursions of linear growth processes

Stochastic Processes and their Applications

Volumn 65, Issue 1, 1996, Pages 31-53

  Erhardsson, Torkel ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Coupling; Linear growth process; Number of excursions; Poisson convergence; Poisson point process; Stein Chen method; Total variation distance

Indexed keywords

EID: 0030582812     PISSN: 03044149     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-4149(96)00097-X     Document Type: Article

References (8)

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