A high resolution photoionization study of Ne and Ar: Observation of mass analyzed threshold ions using synchrotron radiation and direct current electric fields

Journal of Chemical Physics

Volumn 105, Issue 10, 1996, Pages 3950-3961

  Hsu, C W ^a   Lu, K T ^a,c   Evans, M ^b   Chen, Y J ^b   Ng, C Y ^b   Heimann, P ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CALCULATIONS; ELECTRIC FIELD EFFECTS; IONS; LIGHT SOURCES; MASS SPECTROMETRY; MONOCHROMATORS; NEON; RESONANCE; SYNCHROTRON RADIATION; VOLTAGE MEASUREMENT;

MASS ANALYZED THRESHOLD IONS; PHOTOIONIZATION EFFICIENCY; QUANTUM DEFECTS; RYDBERG STATES; STARK EFFECTS; VACUUM ULTRAVIOLET PHOTON SOURCE;

PHOTOIONIZATION;

EID: 0030575575     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.472268     Document Type: Article

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