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Volumn 68, Issue 15, 1996, Pages 2052-2054
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Losses in polycrystalline silicon waveguides
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CALCULATIONS;
CHEMICAL POLISHING;
LIGHT SCATTERING;
MICROSTRUCTURE;
OPTICAL VARIABLES MEASUREMENT;
POLYCRYSTALLINE MATERIALS;
REFLECTOMETERS;
SEMICONDUCTING SILICON;
SILICA;
SURFACE ROUGHNESS;
BOND AND ETCHBACK SILICON ON INSULATOR MATERIALS;
CHEMICAL MECHANICAL POLISHING;
CUTBACK TECHNIQUES;
SPECULAR REFLECTANCE;
WAVEGUIDE LOSSES;
WAVEGUIDES;
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EID: 0030575001
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.116300 Document Type: Article |
Times cited : (49)
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References (21)
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