-
1
-
-
0020114594
-
The impact of inspector fallibility on the inspection policy in serial production systems
-
Ballou, D.P., and Pazer, H.L., "The impact of inspector fallibility on the inspection policy in serial production systems", Management Science 28 (1982) 387-399.
-
(1982)
Management Science
, vol.28
, pp. 387-399
-
-
Ballou, D.P.1
Pazer, H.L.2
-
2
-
-
0000096788
-
Optimal screening plans for non-serial production systems
-
Britney, R.R., "Optimal screening plans for non-serial production systems", Management Science 18 (1972) 550-559.
-
(1972)
Management Science
, vol.18
, pp. 550-559
-
-
Britney, R.R.1
-
3
-
-
0026170778
-
Analysis of operating strategies in test/repair areas
-
Doshi, B., "Analysis of operating strategies in test/repair areas", International Journal of Production Research 29/6 (1991) 1171-1183.
-
(1991)
International Journal of Production Research
, vol.29
, Issue.6
, pp. 1171-1183
-
-
Doshi, B.1
-
4
-
-
0016048858
-
Optimal location of inspection stations in a multi-stage production process
-
Eppen, G.D., and Hurst, E.G. "Optimal location of inspection stations in a multi-stage production process", Management Science 20 (1974) 1194-1200.
-
(1974)
Management Science
, vol.20
, pp. 1194-1200
-
-
Eppen, G.D.1
Hurst, E.G.2
-
5
-
-
0003421261
-
-
Wiley, New York
-
Feller, W., An Introduction to Probability Theory and its Applications, Volume I, 3rd ed., Wiley, New York, 1968.
-
(1968)
An Introduction to Probability Theory and Its Applications, Volume I, 3rd Ed.
, vol.1
-
-
Feller, W.1
-
6
-
-
0017984961
-
Economic batch quantity in a multi-stage production system
-
Goyal, S.K., "Economic batch quantity in a multi-stage production system", International Journal of Production Research 16 (1978) 267-273.
-
(1978)
International Journal of Production Research
, vol.16
, pp. 267-273
-
-
Goyal, S.K.1
-
8
-
-
0026944363
-
Control of batch processing systems in semi-conductor wafer fabrication facilities
-
Gurnani, H., Anupindi, R., and Akella, R., "Control of batch processing systems in semi-conductor wafer fabrication facilities", IEEE Transactions on Semiconductor Manufacturing 5/4 (1992) 319-328.
-
(1992)
IEEE Transactions on Semiconductor Manufacturing
, vol.5
, Issue.4
, pp. 319-328
-
-
Gurnani, H.1
Anupindi, R.2
Akella, R.3
-
9
-
-
0041583652
-
Optimal batch size for multi-stage production inventory systems
-
Kumar, U., and Vrat, P., "Optimal batch size for multi-stage production inventory systems", Opsearch 15 (1978) 78-93.
-
(1978)
Opsearch
, vol.15
, pp. 78-93
-
-
Kumar, U.1
Vrat, P.2
-
10
-
-
0000140746
-
Allocation of screening inspection effort: A dynamic programming approach
-
Lindsay, G.F., and Bishop, A.B., "Allocation of screening inspection effort: A dynamic programming approach", Management Science 10 (1969) 342-352.
-
(1969)
Management Science
, vol.10
, pp. 342-352
-
-
Lindsay, G.F.1
Bishop, A.B.2
-
11
-
-
0022129421
-
Optimal inspection and ordering policies for products with imperfect quality
-
Lee, H.L., and Rosenblatt, M.J., "Optimal inspection and ordering policies for products with imperfect quality", IIE Transactions 17/3 (1985) 284-289.
-
(1985)
IIE Transactions
, vol.17
, Issue.3
, pp. 284-289
-
-
Lee, H.L.1
Rosenblatt, M.J.2
-
12
-
-
0022680968
-
A comparative study of continuous and periodic inspection policies in deteriorating production systems
-
Rosenblatt, M.J., and Lee, H.L. "A comparative study of continuous and periodic inspection policies in deteriorating production systems", IIE Transactions 18/1 (1986) 2-9.
-
(1986)
IIE Transactions
, vol.18
, Issue.1
, pp. 2-9
-
-
Rosenblatt, M.J.1
Lee, H.L.2
-
14
-
-
0024064273
-
An integrated production-inventory model with reprocessing and inspection
-
Tayi, G.K., and Ballou, D.P. "An integrated production-inventory model with reprocessing and inspection", International Journal of Production Research 8 (1988) 1299-1315.
-
(1988)
International Journal of Production Research
, vol.8
, pp. 1299-1315
-
-
Tayi, G.K.1
Ballou, D.P.2
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